Brief introduction of scanning probe microscope

Scanning probe microscope (SPM) is the general name of scanning tunnel microscope and various new probe microscopes (atomic force microscope AFM, laser force microscope LFM, magnetic microscope MFM, etc.). ) is developed on the basis of scanning tunneling microscope and is a surface analysis instrument developed internationally in recent years. It is a high-tech product integrating optics, mechanics and electricity by comprehensively applying modern scientific and technological achievements such as photoelectron technology, laser technology, weak signal detection technology, precision mechanical design and processing, automatic control technology, digital signal processing technology, applied optics technology, computer high-speed acquisition and control and high-resolution graphics processing technology.