Is chip test bist a structural test?

Bist is a built-in self-test, which generally includes rambist, flashbist and so on. It is a special test algorithm with internal integration, and it also includes test control circuit and output result comparison circuit. It is the actual circuit in the chip.

Scanning is a structural test, which replaces the internal registers of the chip with special registers and then connects them into 1 chain or multi-chain. This method only needs to input the mode at the input end and compare the output at the output end. It doesn't care about the function of the chip, which can save a lot of test case development time and reduce test time.